The New Jersey Institute of Technology's
Electronic Theses & Dissertations Project

Title:	Design of a 320X122 MWIR-CCD PtSi-Si imaging radiometer with automatic optical integration time control
Author:	McCaffrey, Nathaniel Joseph
View Online:	njit-etd1993-121 (xii, 100 pages ~ 3.1 MB pdf)
Department:	Department of Electrical and Computer Engineering
Degree:	Master of Science
Program:	Electrical Engineering
Document Type:	Thesis
Advisory Committee:	Kosonocky, Walter F. (Committee chair) Manikopoulos, Constantine N. (Committee member) Hou, Edwin (Committee member)
Date:	1993-05
Keywords:	Infrared spectroscopy -- Automatic control Radiometer -- Automatic control Thermography
Availability:	Unrestricted
Abstract:	An infrared CCD camera system was designed and developed to operate a 320X244 Schottky-barrier IR-CCD Focal Plane Array (FPA) as an imaging radiometer. The goal of this research was to develop a reliable radiometer capable of resolving temperatures between 50 and 1000°C to within 1°C accuracy using non-contact spectral thermographic methods. To accomodate this wide dynamic range, the imager was operated in a non-interlaced format with variable optical integration times ranging from 120µsec to 122msec. Variable integration control was achieved by employing a "dump and read" timing procedure. To facilitate this operation, novel circuitry was developed for dynamically controlling the CCD waveforms to operate at the required integration time. Circuits were developed to embed critical information in the video signal to facilitate radiometric post-processing. An optoelectronically buffered digital interface was developed to connect the camera system to a Datacube processor. Additional circuitry enabled all frame rates to be displayed on an RS-170 monitor after processing. This system was designed to monitor the temperature of semiconductor wafers in Rapid Thermal Processing (RTP) reactors acting as the feedback control to the flash lamp heat sources.