Niver, Edip (Committee chair)
Li, Kuohsiung (Committee member)
Wu, Gary (Committee member)
Date:
1993-01
Keywords:
Microwave integrated circuits
Metal semiconductor field-effect transistors
Gallium arsenide semiconductors
Availability:
Unrestricted
Abstract:
The nonlinearity analysis for a 0.5μm gate length microwave GaAs metal-semiconductor field-effect transistor (MESFET) by HP85150B Microwave Design System was investigated. The analysis starts with the construction of a large-signal MESFET equivalent circuit model. This model consists of bias dependent elements that were extracted by the optimization of DC and small-signal S-parameter measurement data. The details on this construction procedure are included in this work. The MESFET third-order intermodulation distortion was then simulated by HP85150B Microwave Design System. Reasonable agreement was obtained between simulation and measurement results. Microwave GaAs MESFET nonlinearity principles and large-signal modeling technique review are also presented. Finally, the basis for a physics-based large-signal analytical model is outlined to the interests of a transistor or MMIC design engineer who is concerned in the microwave performance as function of device design parameters such as gate length and channel doping.
If you have any questions please contact the ETD Team, libetd@njit.edu.