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The New Jersey Institute of Technology's Electronic Theses & Dissertations Project
Tsybeskov, Leonid has served on the committee of
35 theses/dissertations that are available online.
* indicates that the advisor was committee chair or co-chair.
Author |
Degree |
Year |
|
Title |
ETD# |
Zeinati, Aseel |
MS |
© 2023 |
|
Characterization of low power HfO2 based switching devices for in-memory computing |
njit-etd2023-015 |
Velpula, Ravi Teja |
PhD |
© 2022 |
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Carrier transport engineering in wide bandgap semiconductors for photonic and memory device applications |
njit-etd2022-060 |
Hafiz, Shihab Bin |
PhD |
© 2021 |
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Colloidal quantum dot (CQD) based mid-wavelength infrared optoelectronics |
njit-etd2021-042 |
Patel, Yuvraj Dineshkumar |
MS |
© 2020 |
|
Treated HfO2 based rram devices with ru, tan, tin as top electrode for in-memory computing hardware |
njit-etd2020-079 |
Chowdhury, Tazima Selim |
PhD |
© 2019 |
|
Supercapacitors with gate electrodes |
njit-etd2019-027 |
Mahendravadi Sivaguru, Kasthuriramanan |
MS |
© 2019 |
* |
Study and modelling of lithium ion cell with accurate soc measurement algorithm using Kalman filter for electric vehicles |
njit-etd2019-070 |
Miao, Xin |
PhD |
© 2019 |
|
Graphene channels interfaced with distributed quantum dots |
njit-etd2019-047 |
Paliwoda, Peter Christopher |
PhD |
© 2018 |
|
Characterization of self-heating effects and assessment of its impact on reliability in finfet technology |
njit-etd2018-058 |
Choudhary, Dipayan Datta |
MS |
© 2017 |
|
III-nitride nanowire light-emitting diodes: design and characterization |
njit-etd2017-062 |
Wang, Xiaolu |
PhD |
© 2017 |
* |
Silicon-germanium nanowire heterojunctions: Optical and electrical properties |
njit-etd2017-004 |
Chaudhry, Ahmad Abbas |
MS |
© 2016 |
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Opto-mechanical design of synchrotron radiation-based far-infrared spectroscopic ellipsometer with strong magnetic-field |
njit-etd2016-001 |
Ding, Yi Ming |
PhD |
© 2016 |
|
Electrical characterization of high-k gate dielectrics for advanced CMOS gate stacks |
njit-etd2016-090 |
Bhuyian, Md Nasir Uddin |
PhD |
© 2015 |
|
Reliability study of Zr and Al incorporated hf based high-k dielectric deposited by advanced processing |
njit-etd2015-013 |
Mala, Selina Akter |
PhD |
© 2015 |
* |
Optical properties of strain-engineered multilayer Si/SiGe nanostructures |
njit-etd2015-025 |
Banerjee, Amrita |
PhD |
© 2012 |
|
Graphene-coated substrates for biochemical and optoelectronic applications |
njit-etd2012-091 |
Modi, Nikhil |
PhD |
© 2012 |
* |
Auger-mediated processes and photoluminescence in group iv semiconductor nanostructures |
njit-etd2012-089 |
Rahim, Nilufa |
PhD |
© 2011 |
|
TiN/HfO2/SiO2/Si gate stacks reliability : Contribution of HfO2 and interfacial SiO2 layer |
njit-etd2011-014 |
Chang, Han-Yun |
PhD |
© 2010 |
* |
Properties and device applications of silicon and silicon-germanium nanostructures with different dimensions |
njit-etd2010-085 |
Lee, Seon Woo |
PhD |
© 2009 |
|
Electrical and optical properties of carbon nanotube intra-connects and conductive polymers |
njit-etd2009-072 |
Li, Ruiqiong |
MS |
© 2009 |
|
Nano-structured platforms as a spectroscopic tool |
njit-etd2009-024 |
O'Malley, Sean M. |
PhD |
© 2009 |
|
Synchrotron radiation-based characterization of GaN- based MQW structures and strongly correlated materials |
njit-etd2009-013 |
Chidambaram, Thenappan |
MS |
© 2008 |
* |
Raman scattering in free standing porous Si films |
njit-etd2008-081 |
Lee, Eun Kyu |
PhD |
© 2008 |
* |
Optical properties and carrier transport in Si/ Si1-xGex nanostructures |
njit-etd2008-063 |
Wu, Michael Yu-Chi |
PhD |
© 2008 |
|
Propagation and scattering of beam waves in vegetation using scalar transport theory |
njit-etd2008-043 |
Chowdhury, Naser Ahmed |
PhD |
© 2007 |
|
Reliability Studies of TiN/Hf-Silicate Based Gate Stacks |
njit-etd2007-076 |
Matsunaga, Takuya |
PhD |
© 2007 |
|
Formation of RDX nanoparticles by rapid expansion of supercritical solution : in situ characterization by laser scattering |
njit-etd2007-050 |
Srinivasan, Purushothaman |
PhD |
© 2007 |
|
Characterization and modeling of low-frequency noise in Hf-based high -kappa dielectrics for future cmos applications |
njit-etd2007-056 |
Garg, Reenu |
PhD |
© 2006 |
|
HfO2 as gate dielectric on Si and Ge substrate |
njit-etd2006-075 |
Verdoni, Luigi Pollara |
MS |
© 2006 |
* |
Submicron patterning using laser interference lithography |
njit-etd2006-106 |
Kundu, Tias |
PhD |
© 2005 |
|
Study of Si/SiO2 interface passivation and SiO2 reliability on deuterium implanted silicon |
njit-etd2005-129 |
Sharma, Varun |
MS |
© 2005 |
* |
Optical properties of SiGe nanostructures |
njit-etd2005-014 |
Kale, Bageshri |
MS |
© 2004 |
|
Study of design tradeoffs of DRAM and SRAM memories, using HSPICE computer simulation |
njit-etd2004-053 |
Lee, Eun Kyu |
MS |
© 2004 |
* |
Carrier transport in Ge nanowires and one dimensional Si/Ge heterojunctions |
njit-etd2004-114 |
Srinivasan, Purushothaman |
MS |
© 2004 |
|
Si-SiO2 interface behavior in n-MOSFETs with screening potential during high-field injection |
njit-etd2004-072 |
Koneru, Lakshmi Susmitha |
MS |
© 2004 |
* |
Transport properties of NC-Si / A-SiO2 superlattices and their applications in non-volatile memory |
njit-etd2004-006 |
If you have any questions please contact the ETD Team, libetd@njit.edu.
Created 4/12/01; updated 8/30/02, 06/30/05
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NJIT's ETD project was given an ACRL/NJ Technology Innovation Honorable Mention Award in spring 2003
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