The New Jersey Institute of Technology's Electronic Theses & Dissertations Project

Tsybeskov, Leonid
has served on the committee of
35 theses/dissertations that are available online.

* indicates that the advisor was committee chair or co-chair.

Author	Degree	Year		Title	ETD#
Zeinati, Aseel	MS	© 2023		Characterization of low power HfO2 based switching devices for in-memory computing	njit-etd2023-015
Velpula, Ravi Teja	PhD	© 2022		Carrier transport engineering in wide bandgap semiconductors for photonic and memory device applications	njit-etd2022-060
Hafiz, Shihab Bin	PhD	© 2021		Colloidal quantum dot (CQD) based mid-wavelength infrared optoelectronics	njit-etd2021-042
Patel, Yuvraj Dineshkumar	MS	© 2020		Treated HfO2 based rram devices with ru, tan, tin as top electrode for in-memory computing hardware	njit-etd2020-079
Chowdhury, Tazima Selim	PhD	© 2019		Supercapacitors with gate electrodes	njit-etd2019-027
Mahendravadi Sivaguru, Kasthuriramanan	MS	© 2019	*	Study and modelling of lithium ion cell with accurate soc measurement algorithm using Kalman filter for electric vehicles	njit-etd2019-070
Miao, Xin	PhD	© 2019		Graphene channels interfaced with distributed quantum dots	njit-etd2019-047
Paliwoda, Peter Christopher	PhD	© 2018		Characterization of self-heating effects and assessment of its impact on reliability in finfet technology	njit-etd2018-058
Choudhary, Dipayan Datta	MS	© 2017		III-nitride nanowire light-emitting diodes: design and characterization	njit-etd2017-062
Wang, Xiaolu	PhD	© 2017	*	Silicon-germanium nanowire heterojunctions: Optical and electrical properties	njit-etd2017-004
Chaudhry, Ahmad Abbas	MS	© 2016		Opto-mechanical design of synchrotron radiation-based far-infrared spectroscopic ellipsometer with strong magnetic-field	njit-etd2016-001
Ding, Yi Ming	PhD	© 2016		Electrical characterization of high-k gate dielectrics for advanced CMOS gate stacks	njit-etd2016-090
Bhuyian, Md Nasir Uddin	PhD	© 2015		Reliability study of Zr and Al incorporated hf based high-k dielectric deposited by advanced processing	njit-etd2015-013
Mala, Selina Akter	PhD	© 2015	*	Optical properties of strain-engineered multilayer Si/SiGe nanostructures	njit-etd2015-025
Banerjee, Amrita	PhD	© 2012		Graphene-coated substrates for biochemical and optoelectronic applications	njit-etd2012-091
Modi, Nikhil	PhD	© 2012	*	Auger-mediated processes and photoluminescence in group iv semiconductor nanostructures	njit-etd2012-089
Rahim, Nilufa	PhD	© 2011		TiN/HfO2/SiO2/Si gate stacks reliability : Contribution of HfO2 and interfacial SiO2 layer	njit-etd2011-014
Chang, Han-Yun	PhD	© 2010	*	Properties and device applications of silicon and silicon-germanium nanostructures with different dimensions	njit-etd2010-085
Lee, Seon Woo	PhD	© 2009		Electrical and optical properties of carbon nanotube intra-connects and conductive polymers	njit-etd2009-072
Li, Ruiqiong	MS	© 2009		Nano-structured platforms as a spectroscopic tool	njit-etd2009-024
O'Malley, Sean M.	PhD	© 2009		Synchrotron radiation-based characterization of GaN- based MQW structures and strongly correlated materials	njit-etd2009-013
Chidambaram, Thenappan	MS	© 2008	*	Raman scattering in free standing porous Si films	njit-etd2008-081
Lee, Eun Kyu	PhD	© 2008	*	Optical properties and carrier transport in Si/ Si1-xGex nanostructures	njit-etd2008-063
Wu, Michael Yu-Chi	PhD	© 2008		Propagation and scattering of beam waves in vegetation using scalar transport theory	njit-etd2008-043
Chowdhury, Naser Ahmed	PhD	© 2007		Reliability Studies of TiN/Hf-Silicate Based Gate Stacks	njit-etd2007-076
Matsunaga, Takuya	PhD	© 2007		Formation of RDX nanoparticles by rapid expansion of supercritical solution : in situ characterization by laser scattering	njit-etd2007-050
Srinivasan, Purushothaman	PhD	© 2007		Characterization and modeling of low-frequency noise in Hf-based high -kappa dielectrics for future cmos applications	njit-etd2007-056
Garg, Reenu	PhD	© 2006		HfO2 as gate dielectric on Si and Ge substrate	njit-etd2006-075
Verdoni, Luigi Pollara	MS	© 2006	*	Submicron patterning using laser interference lithography	njit-etd2006-106
Kundu, Tias	PhD	© 2005		Study of Si/SiO2 interface passivation and SiO2 reliability on deuterium implanted silicon	njit-etd2005-129
Sharma, Varun	MS	© 2005	*	Optical properties of SiGe nanostructures	njit-etd2005-014
Kale, Bageshri	MS	© 2004		Study of design tradeoffs of DRAM and SRAM memories, using HSPICE computer simulation	njit-etd2004-053
Lee, Eun Kyu	MS	© 2004	*	Carrier transport in Ge nanowires and one dimensional Si/Ge heterojunctions	njit-etd2004-114
Srinivasan, Purushothaman	MS	© 2004		Si-SiO2 interface behavior in n-MOSFETs with screening potential during high-field injection	njit-etd2004-072
Koneru, Lakshmi Susmitha	MS	© 2004	*	Transport properties of NC-Si / A-SiO2 superlattices and their applications in non-volatile memory	njit-etd2004-006

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Created 4/12/01; updated 8/30/02, 06/30/05