The New Jersey Institute of Technology's
Electronic Theses & Dissertations Project

Title:	Opto-mechanical design of synchrotron radiation-based far-infrared spectroscopic ellipsometer with strong magnetic-field
Author:	Chaudhry, Ahmad Abbas
View Online:	njit-etd2016-001 (viii, 79 pages ~ 2.5 MB pdf)
Department:	Department of Physics
Degree:	Master of Science
Program:	Applied Physics
Document Type:	Thesis
Advisory Committee:	Sirenko, Andrei (Committee chair) Zhou, Tao (Committee member) Tsybeskov, Leonid (Committee member) Tyson, Trevor (Committee member)
Date:	2016-01
Keywords:	Synchrotron radiation Far-infrared spectroscopic ellipsometer
Availability:	Unrestricted
Abstract:	The objective of this dissertation is to present opto-mechanical design of a synchrotron radiation based far-infrared spectroscopic ellipsometer with a strong external magnetic-field capability. Since high magnetic field has enabled major breakthrough in science such instrument will be highly important to the field of condensed matter physics and characterization of advanced electronic materials. This instrument will be installed at the multi-User facility with the most advanced synchrotron light source: Natonal Synchrotron Source (NSLS-II) at Brookhaven National Laboratory (BNL).The proposed here instrument is capable to measure full Mueller matrix spectroscopic ellipsometry spectra in high magnetic fields of up to 9 Tesla. The designed instrument consists of Polarization State Generator (PSG) chamber, Spectromag optical solenoid (high magnetic field up to 9 T), cryogenic sample stage, Polarization State Analyzer (PSA) chamber, and a bolometer. The PSG and PSA vacuum chambers are separated from the magnet volume with two pairs of gate valves equipped with optical windows. This instrument is capable of using synchrotron radiation in the spectral range of 20 cm-1 and 4000 cm-1. The sample stage could operate in the low temperature range down to 4 K with an option to cool sample down to 1.6 K. This instrument allows User to switch between Faraday and Voigt configurations for external magnetic field. This ellipsometer will be able to measure the full-Mueller matrix spectra using rotating retarders and rotating polarizers.