The New Jersey Institute of Technology's
Electronic Theses & Dissertations Project

Title:	Measurement of the Hall coefficient and electron mobility using Van Der Pauw type Hall effect measurements
Author:	Luo, Hong-Sheng
View Online:	njit-etd1994-105 (ix, 41 pages ~ 2.1 MB pdf)
Department:	Department of Physics
Degree:	Master of Science
Program:	Applied Physics
Document Type:	Thesis
Advisory Committee:	Chin, Ken K. (Committee chair) Hensel, John Charles (Committee member) Yan, Yuan (Committee member)
Date:	1994-10
Keywords:	Semiconductors--Electric properties. Hall effect.
Availability:	Unrestricted
Abstract:	Hall effect measurement in the electrical characterization of semiconductor materials is very important. We set up the Hall effect measurement system and examined the system with a standard sample. The experimental results show that this Hall measurement system worked as well as expected. We also used this system to study the GaAs/GaAs and InGaAs/GaAs which grown by MBE. Finally, we disscussed and consided some common problems of Hall measurement. Some useful formulas and plots are presented.